{"schemaVersion":1,"target":{"type":"reading","id":"24c77eab04d76bb9cd090056c4654c01a082e46c57cf87e721f2c2cb222b50d7","revision":"11041307-fe9b-4a31-8541-91a595b0c58e","revisionKind":"publication-id","title":"Jev and Clef-Flash for Few-Shot Defect Detection Beyond CLIP","url":"https://escapemeridian.com/readings/jev-and-clef-flash-for-few-shot-defect-detection-beyond-clip-24c77eab"},"source":{"type":"source","id":"https://arxiv.org/abs/2610.41199","revision":"ebd03d8355f472b19399403c140c07304b3785183c18818f9c1511b99637bbb2","revisionKind":"sha256-source-text","title":"Beyond CLIP: Calibrated (Few-Shot) Defect Detection With System One Decision Models","url":"https://arxiv.org/abs/2610.41199"},"status":"available","items":[],"next":null,"scope":"Explicit citations in public readings and public file attachments to this reading. Shared topics are not citations. Other artifact types need an explicit reference adapter."}