{"schemaVersion":1,"target":{"type":"reading","id":"800ed5615f8968ec01a02c2735066794c04f8caf68f14cf3d0eaf9e12ee4ed84","revision":"d5887d0a-8a92-45e1-80f4-e01a1f3dde65","revisionKind":"publication-id","title":"Yunwei Bai, Ying Kiat Tan and Tsuhan Chen: PEEK for Diffusion Sampling","url":"https://escapemeridian.com/readings/yunwei-bai-ying-kiat-tan-and-tsuhan-chen-peek-for-diffusion-800ed561"},"source":{"type":"source","id":"https://arxiv.org/abs/2611.05407","revision":"fdd9e12ab7bec36e59ea83e0374b8cf5c6775735e2200f8b25c2a7b03809cc8b","revisionKind":"sha256-source-text","title":"PEEK: One-Step-Look-Ahead Exposure Bias Correction for Diffusion Sampling","url":"https://arxiv.org/abs/2611.05407"},"status":"available","items":[],"next":null,"scope":"Explicit citations in public readings and public file attachments to this reading. Shared topics are not citations. Other artifact types need an explicit reference adapter."}